eds mapping analyses Search Results


iodine atoms  (Gatan Inc)
96
Gatan Inc iodine atoms
Iodine Atoms, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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energy dispersive x ray spectroscopy  (JEOL)
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JEOL energy dispersive x ray spectroscopy
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quefina dual eels spectrometer  (Gatan Inc)
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eds mapping  (JEOL)
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JEOL eds mapping
Eds Mapping, supplied by JEOL, used in various techniques. Bioz Stars score: 98/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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sem mapping analysis  (Oxford Instruments)
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Oxford Instruments sem mapping analysis
Sem Mapping Analysis, supplied by Oxford Instruments, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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jem 2100f operating  (JEOL)
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eds mapping analysis  (Hitachi Ltd)
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Hitachi Ltd eds mapping analysis
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edx imaging mapping version 3 2  (Gatan Inc)
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Gatan Inc edx imaging mapping version 3 2
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energy dispersive spectroscopy mapping  (Verlag GmbH)
90
Verlag GmbH energy dispersive spectroscopy mapping
Energy Dispersive Spectroscopy Mapping, supplied by Verlag GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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eds spectra  (Gatan Inc)
96
Gatan Inc eds spectra
Cross-section TEM images coupled with <t>EDS</t> <t>and</t> <t>EELS</t> analysis of Ni/Ge0.90Sn0.10 samples in the as-deposited state and after RTA annealing at 473, 623, 673 and 823 K.
Eds Spectra, supplied by Gatan Inc, used in various techniques. Bioz Stars score: 96/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/eds+mapping+analyses/APEX+Software+for+EDS/pmc07312141-59-2-8
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energy dispersive x-ray edx analysis dot maps  (BIOTON SA)
90
BIOTON SA energy dispersive x-ray edx analysis dot maps
Cross-section TEM images coupled with <t>EDS</t> <t>and</t> <t>EELS</t> analysis of Ni/Ge0.90Sn0.10 samples in the as-deposited state and after RTA annealing at 473, 623, 673 and 823 K.
Energy Dispersive X Ray Edx Analysis Dot Maps, supplied by BIOTON SA, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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cross sectional sem eds mapping analysis results  (JEOL)
99
JEOL cross sectional sem eds mapping analysis results
Cross-section TEM images coupled with <t>EDS</t> <t>and</t> <t>EELS</t> analysis of Ni/Ge0.90Sn0.10 samples in the as-deposited state and after RTA annealing at 473, 623, 673 and 823 K.
Cross Sectional Sem Eds Mapping Analysis Results, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/eds+mapping+analyses/JSM-7800F+Scanning+Electron+Microscope/10__1021_slash_acsenergylett__5c02573-37-1-7
Average 99 stars, based on 1 article reviews
cross sectional sem eds mapping analysis results - by Bioz Stars, 2026-08
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Image Search Results


Cross-section TEM images coupled with EDS and EELS analysis of Ni/Ge0.90Sn0.10 samples in the as-deposited state and after RTA annealing at 473, 623, 673 and 823 K.

Journal: Journal of Applied Crystallography

Article Title: Impact and behavior of Sn during the Ni/GeSn solid-state reaction

doi: 10.1107/S1600576720003064

Figure Lengend Snippet: Cross-section TEM images coupled with EDS and EELS analysis of Ni/Ge0.90Sn0.10 samples in the as-deposited state and after RTA annealing at 473, 623, 673 and 823 K.

Article Snippet: EELS and EDS spectra were acquired using the Gatan Microscopy Suite 3 ( GMS3 ; Gatan Inc., Pleasanton, CA, USA) software with a dwell time of 0.05 s. The pixel size was approximately 1 nm for all maps.

Techniques: